Technological advances have accelerated the pursuit of transparent conducting thin films (TCFs) with superior mechanical properties, durability, efficient optoelectrical performance and substrate compatibility as a pivotal focus in the realm of flexible transparent electronics. Against this background, this work investigates the fabrication of multilayer silver nanowire (AgNW) thin films reinforced by zinc tin oxide (ZTO) thin film encapsulation on polycarbonate substrates by a combination of sputtering and spin-coating techniques. An investigation of the influence of AgNW percolation networks on the optoelectrical properties of ZTO/AgNW/ZTO hybrid thin films was carried out. The impact of ZTO protective layers on the enhancement of electrical properties, adhesivity, flexibility and environmental stability of the multilayer TCF was elucidated. Additionally, to explore the compatibility of the fabricated TCF in integrated device and stealth applications, its electromagnetic interference shielding properties were investigated. The hybrid TCF showed 99.47% EMI shielding efficiency with an absorption-dominant EMI shielding effectiveness of 22.7 dB in the x-band region.
Keywords: electromagnetic interference shielding; flexible electronics; magnetron sputtering; nanowires; transparent conducting thin films.
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