Editorial: In-situ microscopy
Microscopy (Oxf)
.
2024 Apr 8;73(2):77-78.
doi: 10.1093/jmicro/dfae006.
Authors
Toshie Yaguchi
1
,
Ayako Hashimoto
2
3
,
Junko Matsuda
4
Affiliations
1
Core Technology and Solutions Business Group, Hitachi High-Tech Corporation, 552-53 shinko-cho, Hitachinaka-shi, Ibaraki 312-8504, Japan.
2
In-situ Electron Microscopy Technique Development Group, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan.
3
Degree Programs in Pure and Applied Sciences, University of Tsukuba, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan.
4
International Research Center for Hydrogen Energy, Kyushu University, 744 Motooka, Nishi-ku, Fukuoka 819-0395, Japan.
PMID:
38587809
DOI:
10.1093/jmicro/dfae006
No abstract available