Cross-Validation of the Remarkably High Surface Oxygen Exchange Kinetics of PrBa0.5Sr0.5Co1.5Fe0.5O5+δ: A Combined Thin-Film Mass Relaxation and Bulk Electrical Conductivity Relaxation Study

ACS Appl Mater Interfaces. 2024 Mar 20;16(11):13697-13705. doi: 10.1021/acsami.3c18574. Epub 2024 Mar 11.

Abstract

In this work, we measure the oxygen kinetic properties of double perovskite PrBa0.5Sr0.5Co1.5Fe0.5O5+δ (PBSCF), a material widely used as the air electrode in solid oxide electrochemical cells, by mass relaxation (MR) and electrical conductivity relaxation (ECR) experiments. MR studies are carried out using thin films deposited on a gallium phosphate piezocrystal microbalance, and ECR studies are performed using a bulk bar sample with 97% theoretical density. Measurements are performed at 600 °C over the temperature oxygen partial pressure range from 10-4 to 0.21 atm. Despite the differences in experimental formats and surface microstructural features, the ks values extracted from the two methods are found to be in good agreement with one another. The rate constant is found to increase with oxygen partial pressure with a power law dependence, rising from 1.0 × 10-6 cm/s at 3.2 × 10-4 atm to 1.2 × 10-4 cm/s at 0.24 atm, as averaged over the oxidation and reduction directions. The rates in the oxidation direction are observed to be slightly higher than those in the reduction direction for a given pair of pO2 values, suggesting that the final pO2 value controls the overall relaxation behavior. The power law exponent describing the dependence of ks on pO2 is found to be 0.74 ± 0.01. The ECR study of the bulk sample reveals that even with a diffusion length of 1.8 mm, the relaxation process is largely free of diffusion limitations, indicating that PBSCF has the high bulk transport properties required for a double-phase boundary oxidation/reduction pathway.

Keywords: PrBa0.5Sr0.5Co1.5Fe0.5O5+δ (PBSCF); electrical conductivity relaxation; mass relaxation; oxygen surface exchange kinetics; piezocrystal microbalance.