Research progress of out-of-plane GeSn nanowires

Abstract

With the increasing integration density of silicon-based circuits, traditional electrical interconnections have shown their technological limitations. In recent years, GeSn materials have attracted great interest due to their potential direct bandgap transition and compatibility with silicon-based technologies. GeSn materials, including GeSn films, GeSn alloys, and GeSn nanowires, are adjustable, scalable, and compatible with silicon. GeSn nanowires, as one-dimensional (1D) nanomaterials, including out-of-plane GeSn nanowires and in-plane GeSn nanowires, have different properties from those of bulk materials due to their distinctive structures. However, the synthesis and potential applications of out of plane GeSn nanowires are rarely compared to highlighting their current development status and research trends in relevant review papers. In this article, we present the preparation of out-of-plane GeSn nanowires using top-down (etching and lithography) and bottom-up (vapor-liquid-solid) growth mechanism in the vapor-phase method and supercritical fluid-liquid-solid, solution-liquid-solid, and solvent vapor growth mechanisms in the liquid-phase method) methods. Specifically, the research progress on typical out of plane GeSn nanowires are discussed, while some current development bottlenecks are also been identified. Finally, it is also provided a brief description of the applications of out-of-plane GeSn nanowires with various Sn contents and morphologies.

Keywords: GeSn nanowires; morphology; out-of-plane.