The three-dimensional reconstruction technique has been widely applied across various fields, with imaging serving as a fundamental approach to achieve this reconstruction. In the present study, we employed micro-imaging to realize 3D reconstruction based on the "shape from focus" and the chromatic aberration effect. This approach eliminates the need for sample or imaging lens movement to locate the focal plane for obtaining clear images. Instead, by utilizing tunable illuminance, we can adjust the imaging distance through the chromatic aberration, thereby achieving accurate reconstructions. As a means of verification, a simple system was accordingly constructed with an adjustable illuminance range (500-750 nm) at a magnification of 10× for imaging purposes. The fine reconstruction achieved high precision in micrometers; however, the depth of field emerged as an issue during the reconstruction process. To assess this method, a coin was employed, and the resulting reconstruction bias was determined to be as low as 0.01 mm. These findings indicate that the proposed method is practical for surface reconstruction and its capabilities will be further enhanced through optical design improvements.