Our paper introduces a simulation-based framework designed to interpret differential phase contrast (DPC) magnetic imaging within the transmission electron microscope (TEM). We investigate patterned magnetic membranes, particularly focusing on nano-patterned Co70Fe30 thin-film membranes fabricated via focused ion beam (FIB) milling. Our direct magnetic imaging reveals regular magnetic domain patterns in these carefully prepared systems. Notably, the observed magnetic structure aligns precisely with micromagnetic simulations based on the dimensions of the underlying nanostructures. This agreement emphasizes the usefulness of micromagnetic simulations, not only for the interpretation of DPC data, but also for the prediction of possible microstructures in magnetic sensor systems with nano-patterns.
Keywords: differential phase contrast (DPC) magnetic imaging; focused ion beam (FIB) milling; micromagnetic simulations; nano-patterned thin-film membranes.