Half-value layer measurements using solid-state detectors and single-rotation technique with lead apertures in spiral computed tomography with and without a tin filter

Abstract

Solid-state detectors (SSDs) may be used along with a lead collimator for half-value layer (HVL) measurement using computed tomography (CT) with or without a tin filter. We aimed to compare HVL measurements obtained using three SSDs (AGMS-DM+ , X2 R/F sensor, and Black Piranha) with those obtained using the single-rotation technique with lead apertures (SRTLA). HVL measurements were performed using spiral CT at tube voltages of 70-140 kV without a tin filter and 100-140 kV (Sn 100-140 kV) with a tin filter in increments of 10 kV. For SRTLA, a 0.6-cc ionization chamber was suspended at the isocenter to measure the free-in-air kerma rate ( ${\dot{K}}_{\text{air}}$ ) values. Five apertures were made on the gantry cover using lead sheets, and four aluminum plates were placed on these apertures. HVLs in SRTLA were obtained from ${\dot{K}}_{\text{air}}$ decline curves. Subsequently, SSDs inserted into the lead collimator were placed on the gantry cover and used to measure HVLs. Maximum HVL differences of AGMS-DM+ , X2 R/F sensor, and Black Piranha with respect to SRTLA without/with a tin filter were - 0.09/0.6 (only two Sn 100-110 kV) mm, - 0.50/ - 0.6 mm, and - 0.17/(no data available) mm, respectively. These values were within the specification limit. SSDs inserted into the lead collimator could be used to measure HVL using spiral CT without a tin filter. HVLs could be measured with a tin filter using only the X2 R/F sensor, and further improvement of its calibration accuracy with respect to other SSDs is warranted.

Keywords: Half-value layer; Single-rotation technique with lead apertures; Solid-state detector; X-ray CT system.