Analysis and mitigation of an oscillating background on hybrid complementary metal-oxide semiconductor (hCMOS) imaging sensors at the National Ignition Facility

B R Hassard; M S Dayton; C Trosseille; L R Benedetti; H Chen; T Döppner; C E Durand; G N Hall; S B Morioka; P R Nyholm; Y Ping; A Sharp; A C Carpenter; S R Nagel

doi:10.1063/5.0165487

Analysis and mitigation of an oscillating background on hybrid complementary metal-oxide semiconductor (hCMOS) imaging sensors at the National Ignition Facility

Rev Sci Instrum. 2023 Dec 1;94(12):123505. doi: 10.1063/5.0165487.

Authors

B R Hassard¹, M S Dayton², C Trosseille¹, L R Benedetti¹, H Chen¹, T Döppner¹, C E Durand¹, G N Hall¹, S B Morioka¹, P R Nyholm¹, Y Ping¹, A Sharp¹, A C Carpenter¹, S R Nagel¹

Affiliations

¹ Lawrence Livermore National Laboratory, 7000 East Ave., Livermore, California 94550, USA.
² Advanced hCMOS Systems, 6300 Riverside Plaza NW, Suite 100 PMB 3012, Albuquerque, New Mexico 87120, USA.

PMID: 38088778
DOI: 10.1063/5.0165487

Abstract

Nanosecond-gated hybrid complementary metal-oxide semiconductor imaging sensors are a powerful tool for temporally gated and spatially resolved measurements in high energy density science, including inertial confinement fusion, and in laser diagnostics. However, a significant oscillating background excited by photocurrent has been observed in image sequences during testing and in experiments at the National Ignition Facility (NIF). Characterization measurements and simulation results are used to explain the oscillations as the convolution of the pixel-level sensor response with a sensor-wide RLC circuit ringing. Data correction techniques are discussed for NIF diagnostics, and for diagnostics where these techniques cannot be used, a proof-of-principle image correction algorithm is presented.