Despite the fundamental and technological importance of the elastic constants, a suitable method for their full characterization in epitaxial films is missing. Here we show that transient grating spectroscopy (TGS) with highly k-vector-selective generation and detection of acoustic waves is capable of determination of all independent elastic coefficients of an epitaxial thin film grown on a single-crystalline substrate. This experimental setup enables detection of various types of guided acoustic waves and evaluation of the directional dependence of their speeds of propagation. For the studied model system, which is a 3μm thin epitaxial film of the NiTi shape memory alloy on an MgO substrate, the TGS angular maps include Rayleigh-type surface acoustic waves as well as Sezawa-type and Love-type modes, delivering rich information on the elastic response of the film under different straining modes. The resulting inverse problem, which means the calculation of the elastic constants from the TGS maps, is subsequently solved using the Ritz-Rayleigh numerical method. Using this approach, tetragonal elastic constants of the NiTi film and their changes with the austenite→martensite phase transition are analyzed.
Keywords: Elastic anisotropy; Epitaxial thin film; Guided acoustic waves; Inverse problem; Ritz–Rayleigh method; Shape memory alloys; Transient grating spectroscopy.
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