Flash-sintered (FS) ceramics have shown promising mechanical deformability at room temperature compared to conventional sintered ceramics. One major contributing factor to plasticity is high-density defects, such as dislocations, stacking faults and point defects, resulted presumably from the high electrical field during flash sintering. However, such direct experiemtnal evidence for defect formation and evolution under the electric field remains lacking. Here we performed in situ biasing experiments in FS and conventionally sintered (CS) polycrystalline TiO2 in a transmission electron microscope (TEM) to compare the defect evolution dynamics. In situ TEM studies revealed the coalescence of point defects under the electrical field in both FS and CS TiO2 and the subsequent formation of stacking faults, which are often referred to as Wadsley defects. Surprisingly, under the electrical field, the average fault growth rate in the FS samples is 10 times as much as that in the CS TiO2. Furthermore, the Magnéli phase, a 3D oxygen-deficient phase formed by the aggregation of Wadsley defects, is observed in the FS samples, but not in the CS samples. The present study provides new insights into defect dynamics in FS ceramics.