The unique magnetic field environment during electromagnetic launch imposes higher requirements on the design and protection of the internal electronic system within the launch load. This low-frequency, Tesla-level extreme magnetic field environment is fundamentally distinct from the Earth's geomagnetic field. The excessive change rate of magnetic flux can readily induce voltage within the circuit, thus disrupting the normal operation of intelligent microchips. Existing simulation methods primarily focus on the physical environments of rails and armatures, making it challenging to precisely compute the magnetic field environment at the load's location. In this paper, we propose a computational rail model based on the magneto-mechanical coupling model of a railgun. This model accounts for the dynamic current distribution during the launch process and simulates the magnetic flux density distribution at the load location. To validate the model's accuracy, three-axis magnetic sensors were placed in front of the armature, and the dynamic magnetic field distribution during the launch process was obtained using the projectile-borne-storage testing method. The results indicate that compared to the previous literature methods, the approach proposed in this paper achieves higher accuracy and is closer to experimental results, providing valuable support for the design and optimization of the launch load.
Keywords: coupled simulation; electromagnetic rail launch; magnetic diffusion; projectile-borne measurement; velocity skin effect.