The qualitative X-ray phase analysis of natural and artificial food sweeteners was applied to trace the authenticity of such food additives. The mineral composition of different sweeteners commonly added to foods was studied to estimate their mineral profiles and assess the risk related to the toxic elements intake caused by sweetener consumption. The concentration of twenty elements (Ag, Al, B, Ba, Bi, Ca, Cd, Co, Cr, Cu, Fe, Mg, Mn, Mo, Ni, Pb, Sr, Ti, V, and Zn) was measured using the inductively coupled plasma-optical emission spectroscopy (ICP-OES) method after the representative samples were wet-digested with a concentrated nitric acid and hydrogen peroxide mixture in a closed-vessel microwave-assisted system. Differences between the mineral compositions of the examined sweeteners were statistically evaluated and discussed. The relationships between the concentrations of the elements determined in the analyzed sweeteners were also investigated. The successful application of the X-ray powder diffraction method proved the identity of all investigated sweeteners; all the analyzed products contained the expected sweetening agent. The results of the quantification of all the elements in the examined sweeteners indicated that these products cannot be considered nutritionally dense. Hence, the presence of toxic elements like Cd, Cr, Ni, and Pb distinctly indicates the need to test such products to guarantee their quality and ensure consumer safety.
Keywords: ICP-OES; XRD; mineral composition; multielement analysis; natural; phase analysis; plant-derived and artificial food sweeteners.