Secondary fluorescence (SF) is known to be a potential source of error in electron probe microanalysis (EPMA) when analyzing for a trace or minor element near a phase boundary. This often overlooked effect leads to a concentration enhancement whenever the neighboring phase contains a high concentration of the analyzed element. Here we show that SF may also lead to a concentration decrease, which can be mistakenly interpreted as a depletion. To examine this issue, we compare Ni profiles measured on well-characterized, homogeneous olivine [(Mg,Fe)2SiO4] grains embedded in basaltic glass, with semi-analytical calculations and numerical simulations of SF across phase boundaries. We find that the Ni content consistently decreases with decreasing distance to the interface or grain radius, deviating from the expected concentration by ∼2-5% at 10 μm from the interface. This decrease is explained by the lower bremsstrahlung fluorescence emitted from the sample as compared to that emitted from the standard. The analytical error due to boundary fluorescence affecting other elements of petrologic importance in olivine is discussed.
Keywords: electron probe microanalysis; nickel; olivine; secondary fluorescence; trace analysis.
© The Author(s) 2023. Published by Oxford University Press on behalf of the Microscopy Society of America.