Recently, metric-based meta-learning methods have been effectively applied to few-shot image classification. These methods classify images based on the relationship between samples in an embedding space, avoiding over-fitting that can occur when training classifiers with limited samples. However, finding an embedding space with good generalization properties remains a challenge. Our work highlights that having an initial manifold space that preserves sample neighbor relationships can prevent the metric model from reaching a suboptimal solution. We propose a feature learning method that leverages Instance Neighbor Constraints (INC). This theory is thoroughly evaluated and analyzed through experiments, demonstrating its effectiveness in improving the efficiency of learning and the overall performance of the model. We further integrate the INC into an alternate optimization training framework (AOT) that leverages both batch learning and episode learning to better optimize the metric-based model. We conduct extensive experiments on 5-way 1-shot and 5-way 5-shot settings on four popular few-shot image benchmarks: miniImageNet, tieredImageNet, Fewshot-CIFAR100 (FC100), and Caltech-UCSD Birds-200-2011(CUB). Results show that our method achieves consistent performance gains on benchmarks and state-of-the-art performance. Our findings suggest that initializing the embedding space appropriately and leveraging both batch and episode learning can significantly improve few-shot learning performance.