Conventional time-of-flight methods can be used to determine carrier mobilities for photovoltaic cells in which the transit time between electrodes is greater than the RC time constant of the device. To measure carrier drift on sub-ns timescales, we have recently developed a two-pulse time-of-flight technique capable of detecting drift velocities with 100-ps time resolution in perovskite materials. In this method, the rates of carrier transit across the active layer of a device are determined by varying the delay time between laser pulses and measuring the magnitude of the recombination-induced nonlinearity in the photocurrent. Here, we present a related experimental approach in which diffractive optic-based transient grating spectroscopy is combined with our two-pulse time-of-flight technique to simultaneously probe drift and diffusion in orthogonal directions within the active layer of a photovoltaic cell. Carrier density gratings are generated using two time-coincident pulse-pairs with passively stabilized phases. Relaxation of the grating amplitude associated with the first pulse-pair is detected by varying the delay and phase of the density grating corresponding to the second pulse-pair. The ability of the technique to reveal carrier diffusion is demonstrated with model calculations and experiments conducted using MAPbI3 photovoltaic cells.
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