This paper proposes a novel design of shielded two-turn near-field probe with focus on high sensitivity and high electric field suppression. A comparison of different two-turn loop topologies and their influence on the probe sensitivity in the frequency range up to 3 GHz is presented. Furthermore, a comparison between a single loop probe and a two-turn probe is given and different topologies of the two-turn probe are analyzed and evaluated. The proposed probes were simulated using Ansys HFSS and manufactured on a standard FR4 substrate four-layer printed circuit board (PCB). A measurement setup for determining probe sensitivity and electric field suppression ratio using an in-house made PCB probe stand, vector network analyzer, microstrip line (MSL) and the manufactured probe is presented. It is shown that using a two-turn probe design it is possible to increase the probe sensitivity while minimizing the influence on the probe spatial resolution. The average sensitivity of the proposed two-turn probe compared to the conventional design is increased by 10.1 dB in the frequency range from 10 MHz up to 1 GHz.
Keywords: electromagnetic compatibility measurements; magnetic field measurement; magnetic near-field probe; probe sensitivity.