Characterization of High Entropy Oxide Thin Films by High-Resolution STEM-EELS
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):1768-1769.
doi: 10.1093/micmic/ozad067.916.
Authors
Sai Venkata Gayathri Ayyagari
1
,
Leixin Miao
1
,
Matthew Webb
2
,
John Heron
2
,
Nasim Alem
1
Affiliations
1
Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania, United States.
2
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan, United States.
PMID:
37613938
DOI:
10.1093/micmic/ozad067.916
No abstract available