Dopant Mapping of Partially Hydrogenated Vanadium Dioxide using the Energy Loss Near Edge Structure Technique
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):1667-1668.
doi: 10.1093/micmic/ozad067.858.
Authors
A Pofelski
1
,
S Deng
2
,
H Yu
2
,
T J Park
2
,
H Jia
3
,
S Manna
3
4
,
M K Y Chan
3
,
S K Rs Sankaranarayanan
3
4
,
S Ramanathan
2
5
,
Y Zhu
1
Affiliations
1
Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, Upton, NY, USA.
2
School of Materials Engineering, Purdue University, West Lafayette, IN, USA.
3
Center for Nanoscale Materials, Argonne National Laboratory, Lemont, IL, USA.
4
Department of Mechanical and Industrial Engineering, University of Illinois, Chicago, IL, USA.
5
Department of Electrical and Computer Engineering, Rutgers, The State University of New Jersey, Piscataway, NJ, USA.
PMID:
37613910
DOI:
10.1093/micmic/ozad067.858
No abstract available