Mapping Conductivity in the TEM with SEEBIC
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):1851-1852.
doi: 10.1093/micmic/ozad067.956.
Authors
William A Hubbard
1
,
Ho Leung Chan
2
3
,
B C Regan
1
2
3
Affiliations
1
NanoElectronic Imaging, Inc., Los Angeles, CA, United States.
2
University of California Los Angeles, Los Angeles, United States.
3
California NanoSystems Institute, University of California, Los Angeles, United States.
PMID:
37613897
DOI:
10.1093/micmic/ozad067.956
No abstract available