In Operando Transmission Electron Microscopy Studies on Diffusion-Induced Phenomena at Dielectric-Electrode Interfaces in Ge2Te3-Based Memristor Devices
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):1611-1612.
doi: 10.1093/micmic/ozad067.827.
Authors
Krishnamurthy Mahalingam
1
,
Austin Shallcross
2
,
Cynthia T Bowers
1
,
Derek Winner
1
,
Albert Hilton
1
,
Sabyasachi Ganguli
1
,
Eunsung Shin
2
,
Guru Subramanyam
2
Affiliations
1
Air Force Research Laboratory, Materials and Manufacturing Directorate, Wright-Patterson AFB, OHUnited States.
2
Department of Electrical and Computer Engineering, University of Dayton, Dayton, OH, United States.
PMID:
37613895
DOI:
10.1093/micmic/ozad067.827
No abstract available