Development of a Stable Cryogenic In Situ Biasing System for Atomic Resolution (S)TEM
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):1695.
doi: 10.1093/micmic/ozad067.873.
Authors
Yevheniy Pivak
1
,
Hongyu Sun
1
,
Tijn van Omme
1
,
Eva Bladt
1
,
H Hugo Pérez-Garza
1
,
Michelle Conroy
2
,
Leopoldo Molina-Luna
3
Affiliations
1
DENSsolutions, Informaticalaan 12, Delft, TheNetherlands.
2
Michelle Conroy, Department of Materials, Faculty of Engineering, Imperial College London, London, The United Kingdom.
3
Advanced Electron Microscopy Division (AEM), TU Darmstadt, Darmstadt, Germany.
PMID:
37613892
DOI:
10.1093/micmic/ozad067.873
No abstract available