Emission-Based Temperature Mapping with STEM EBIC
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):1608-1609.
doi: 10.1093/micmic/ozad067.825.
Authors
William A Hubbard
1
,
Matthew Mecklenburg
2
3
,
Ho Leung Chan
2
3
,
B C Regan
1
2
3
Affiliations
1
NanoElectronic Imaging, Inc., Los Angeles, CA, United States.
2
University of California Los Angeles, Los Angeles, United States.
3
California NanoSystems Institute, University of California, Los Angeles, United States.
PMID:
37613837
DOI:
10.1093/micmic/ozad067.825
No abstract available