Thickness-Dependent Layer Stacking Disorder in Low and High Temperature Phase of MoTe2 via STEM Imaging
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):1735-1736.
doi: 10.1093/micmic/ozad067.897.
Authors
Lopa Bhatt
1
,
James L Hart
2
,
Elisabeth Bianco
3
,
Judy Cha
2
,
Lena F Kourkoutis
1
3
Affiliations
1
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, United States.
2
Department of Materials Science and Engineering, Cornell University, Ithaca, NY, United States.
3
Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY, United States.
PMID:
37613765
DOI:
10.1093/micmic/ozad067.897
No abstract available