Extending 4D-STEM to Defect and Short-range Ordering Analysis: Principles, Methodology and Applications

Jian-Min Zuo; Haw-Wen Hsiao; Kaijun Yin; Hsu-Chih Ni; Haoyang Ni; Robert Busch; Renliang Yuan; Jiong Zhang

doi:10.1093/micmic/ozad067.112

Extending 4D-STEM to Defect and Short-range Ordering Analysis: Principles, Methodology and Applications

Microsc Microanal. 2023 Jul 22;29(Supplement_1):249-250. doi: 10.1093/micmic/ozad067.112.

Authors

Jian-Min Zuo^{1

2}, Haw-Wen Hsiao^{1

2}, Kaijun Yin^{1

2}, Hsu-Chih Ni^{1

2}, Haoyang Ni^{1

2}, Robert Busch^{1

2}, Renliang Yuan^{1

2

3}, Jiong Zhang³

Affiliations

¹ Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois, United States of America.
² Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois, United States of America.
³ Intel Corp., Hillsboro, Oregon, United States of America.

PMID: 37613551
DOI: 10.1093/micmic/ozad067.112

No abstract available