Deformation Defects Characterization in Short-range Ordered CrCoNi using Fast Electron Detectors and 4D-STEM

Microsc Microanal. 2023 Jul 22;29(Supplement_1):251-253. doi: 10.1093/micmic/ozad067.113.

Kaijun Yin^{1

2}, Haw-Wen Hsiao^{1

2}, Rui Feng³, Peter K Liaw⁴, Jian-Min Zuo^{1

2}

¹ Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois, United States of America.
² Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois, United States of America.
³ Neutron Scattering Division, Oak Ridge National Laboratory, Oak Ridge, TN, United States.
⁴ Department of Materials Science and Engineering, The University of Tennessee Knoxville, Knoxville, TN, United States.

No abstract available