Evaluation by SEM-EDS of the Presence of Manufacturing Residual Materials on Non-invasive Ventilation (NIV) Masks
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):150-151.
doi: 10.1093/micmic/ozad067.068.
Authors
Guillermina González-Mancera
1
,
Nicolas Mervich-Sigal
2
,
Brenda A Paz-Michel
2
,
Joaquin Morales-García
3
Affiliations
1
Scanning Electron Microscopy Laboratory, Chemistry Faculty. National Autonomous University of Mexico, México.
2
Department of Research, Esteripharma, México.
3
English department, Chemistry Faculty. National Autonomous University of Mexico, México.
PMID:
37613155
DOI:
10.1093/micmic/ozad067.068
No abstract available