Installation of New Systems for High-Energy Electron Energy-loss Spectrometry in an Aberration-Corrected Scanning Transmission Electron Microscope
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):416-417.
doi: 10.1093/micmic/ozad067.196.
Authors
Masashi Watanabe
1
,
Giulio Guzzinati
2
,
Pirmin Kükelhan
2
,
Volker Gerheim
2
,
Martin Linck
2
,
Heiko Müller
2
,
Max Haider
2
,
Thomas F Hoffman
3
,
Thomas Isabell
3
,
Naoki Shimura
3
,
Hidetaka Sawada
3
Affiliations
1
Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA, United States.
2
CEOS GmbH, Heidelberg, Germany.
3
JEOL USA, Peabody, MA, United States.
PMID:
37613132
DOI:
10.1093/micmic/ozad067.196
No abstract available