GaBiLi - A Novel Focused Ion Beam (FIB) Source for Ion Microscopy and Related Workflows for 3D Tomography with a Top-Down FIB From Liquid Metal Alloy Ion Sources (LMAIS)
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):536-537.
doi: 10.1093/micmic/ozad067.252.
Authors
Torsten Richter
1
,
Achim Nadzeyka
1
,
Paul Mazarov
1
,
Fabian Meyer
1
Affiliation
1
Raith GmbH, Dortmund, Germany.
PMID:
37613092
DOI:
10.1093/micmic/ozad067.252
No abstract available