Continuous Multiple Pass Electron Counted Spectrum Imaging Optimized for In-Situ Analysis
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):371-372.
doi: 10.1093/micmic/ozad067.173.
Authors
Liam Spillane
1
,
Benjamin Miller
1
,
Bernhard Schaffer
1
,
Paul J Thomas
1
,
Ray D Twesten
1
,
Michele Conroy
2
Affiliations
1
Gatan Inc., Pleasanton, CA, USA.
2
Department of Materials, Imperial College London, UK.
PMID:
37613031
DOI:
10.1093/micmic/ozad067.173
No abstract available