Developments in Broad Ion Beam Milling Sample Preparation Instrumentation for Microscopy and Microanalysis Applications
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):2075-2076.
doi: 10.1093/micmic/ozad067.1074.
Authors
Pawel Nowakowski
1
,
Cecile Bonifacio
1
,
Mary Ray
1
,
Paul Fischione
1
Affiliation
1
E.A. Fischione Instruments, Inc. Export, PA, USA.
PMID:
37612996
DOI:
10.1093/micmic/ozad067.1074
No abstract available