Spectral CT in the World of Electronics: Moving Toward Failure Free Devices
Microsc Microanal
.
2023 Jul 22;29(Supplement_1):2003.
doi: 10.1093/micmic/ozad067.1036.
Authors
Jan Dewanckele
1
,
Marijn Boone
1
,
Denis Van Loo
1
,
Wesley De Boever
1
Affiliation
1
TESCAN XRE, Ghent, Belgium.
PMID:
37612976
DOI:
10.1093/micmic/ozad067.1036
No abstract available