In this work, we studied the impact of environmental constituents such as oxygen (O2) and moisture on halide double perovskite (HDP) films. The transport measurements indicate that an increment in O2 concentration enhances the resistivity of a Cs2AgBiBr6 film by two orders of magnitude. The adsorption of O2 on the film's surface helps in passivation of defects (∼50% reduction in defect density on O2 exposure), which inhibits ion migration and results in an increased resistivity of the film. The process of adsorption and desorption of O2 on the film surface is found to be fully reversible. In contrast, the resistivity of double perovskite films decreases by an order of magnitude in the presence of moisture. This is attributed to the generation of free protons as a result of the dissociation of water molecules at the films' surface, hence exhibiting an increase in current under external bias. The HDP films possess high resistivity (for T < 100 °C) due to the desorption of physisorbed water layers from the surface, which gradually decreases with an increase in the operating temperature. This work demonstrates that O2 and moisture are a good combination for defect passivation in any HDPs, in general.
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