Universal N2O Reaction Gas To Remove Spectral Interferences of Nonmetallic Impurity Elements by Inductively Coupled Plasma Tandem Mass Spectrometry Analysis of High-Purity Magnesium Alloys

Liang Fu; Guangsheng Huang; Yaobo Hu; Xianhua Chen; Jingfeng Wang; Fusheng Pan

doi:10.1021/acs.analchem.2c04942

Universal N₂O Reaction Gas To Remove Spectral Interferences of Nonmetallic Impurity Elements by Inductively Coupled Plasma Tandem Mass Spectrometry Analysis of High-Purity Magnesium Alloys

Anal Chem. 2023 Mar 21;95(11):4950-4956. doi: 10.1021/acs.analchem.2c04942. Epub 2023 Feb 20.

Authors

Liang Fu^{1

2}, Guangsheng Huang^{1

2}, Yaobo Hu^{1

2}, Xianhua Chen^{1

2}, Jingfeng Wang^{1

2}, Fusheng Pan^{1

2}

Affiliations

¹ College of Materials Science and Engineering, Chongqing University, Chongqing 400045, China.
² National Engineering Research Center for Magnesium Alloys, Chongqing University, Chongqing 400045, China.

PMID: 36802512
DOI: 10.1021/acs.analchem.2c04942

Abstract

Using N₂O as a universal reaction gas, a new strategy was proposed for the highly sensitive interference-free simultaneous determination of nonmetallic impurity elements in high-purity magnesium (Mg) alloys by ICP-MS/MS. In the MS/MS mode, through O-atom and N-atom transfer reactions, ²⁸Si⁺ and ³¹P⁺ were converted to the oxide ions ²⁸Si¹⁶O₂⁺ and ³¹P¹⁶O⁺, respectively, while ³²S⁺ and ³⁵Cl⁺ were converted to the nitride ions ³²S¹⁴N⁺ and ¹⁴N³⁵Cl⁺, respectively. The ion pairs formed via the ²⁸Si⁺ → ²⁸Si¹⁶O₂⁺, ³¹P⁺ → ³¹P¹⁶O⁺, ³²S⁺ → ³²S¹⁴N⁺, and ³⁵Cl⁺ → ¹⁴N³⁵Cl⁺ reactions by the mass shift method could eliminate spectral interferences. Compared with the O₂ and H₂ reaction modes, the present approach delivered much higher sensitivity and lower limit of detection (LOD) of the analytes. The accuracy of the developed method was evaluated via standard addition method and comparative analysis by sector field ICP-MS (SF-ICP-MS). The study indicates that in the MS/MS mode, use of N₂O as reaction gas can provide interference-free conditions and sufficiently low LODs for analytes. The LODs of Si, P, S, and Cl could reach down to 17.2, 4.43, 10.8, and 31.9 ng L^-1, respectively, and the recoveries were in the range of 94.0-106%. The determination results of the analytes were consistent with those obtained by SF-ICP-MS. This study presents a systematic method for the precise and accurate quantification of Si, P, S, and Cl in high-purity Mg alloys by ICP-MS/MS. The developed method provides valuable reference that can be expanded and applied to other fields.