Cu3Sn joint based on transient liquid phase bonding of Cu@Cu6Sn5 core-shell particles

Sci Rep. 2023 Jan 12;13(1):668. doi: 10.1038/s41598-023-27870-3.

Abstract

With the development of high-integration and high-power electronics, the lack of matching chip connecting materials that can withstand high temperatures has been a challenge. In this manuscript, a Cu@Cu6Sn5 core-shell bimetallic particles (approx. 1 μm in diameter) are successfully prepared and introduced as a new solder material for the packaging of power devices to obtain a Cu3Sn all-IMC solder joint. The joint consisted mainly of equiaxed Cu3Sn grains, and a small portion of columnar Cu3Sn grains. In columnar-type growth, Sn is the dominant diffusing species, which comes from the depletion of Sn in Cu6Sn5. The depleted Cu6Sn5 is transformed into columnar Cu3Sn. In equiaxed-type growth, Cu is the dominant diffusing species. Cu reacts with Cu6Sn5 to grow a Cu3Sn layer. This conclusion was confirmed by the orientation relationship. The equiaxed Cu3Sn grain nucleates at the Cu/Cu3Sn interface have an orientation relationship with the Cu substrate. Columnar Cu3Sn grains at the Cu6Sn5/Cu3Sn interface have an orientation relationship with Cu6Sn5.