Replacement of indium tin oxide with the intrinsically conducting polymer poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate) (PEDOT:PSS) has been of significant interest in recent years as a result of lower processing and material costs. In addition, the inclusion of additives has been reported to further enhance the conductivity, rheology, and wettability of PEDOT:PSS. In this study, Tween 80 was shown to decrease the sheet resistance of PEDOT:PSS films from approximately 1000 to 76 Ω□-1 at a 2.67 wt% surfactant concentration. Through X-ray diffraction, Raman spectroscopy, and atomic force microscopy, it was shown that the surfactant caused phase separation and structural ordering of the PEDOT and PSS components, leading to this improvement in conductivity. Furthermore, Tween 80 altered the rheological properties and decreased the surface tension of PEDOT:PSS, making coating common commodity polymers, often used as flexible substrates, more viable.
Keywords: PEDOT:PSS; Tween 80; microstructural analysis; polymer blend films; polymer thin films; sheet resistance; surface tension.