Metrology Benchmarking of 3D Scanning Sensors Using a Ceramic GD&T-Based Artefact

Sensors (Basel). 2022 Nov 8;22(22):8596. doi: 10.3390/s22228596.

Abstract

The use of non-contact scanning equipment in metrology and in dimensional and geometric inspection applications is increasing due to its ease of use, the speed and density of scans, and the current costs. In fact, these technologies are becoming increasingly dominant in the industrial environment, thus moving from reverse engineering applications to metrological applications. However, this planned transfer requires actions to ensure the achievable accuracy by providing traceability of measurements. In the present study, a comparison between the devices is carried out and a specific standard artefact is designed, equipped with multiple ceramic optically friendly entities, and allowing a wide variety of geometric dimensioning and tolerancing (GD&T). Four different 3D scanning sensors are used in the experimentation. Three of them are based on laser triangulation, and the fourth is a structured blue light sensor (fringe pattern projection). The standard artefact is calibrated with a high accuracy, using a coordinate measuring machine (CMM) and probing sensors. With this CMM, reference values of multiple predefined GD&T are obtained. The evaluation methodology maximises the accuracy of each device in measuring the dimensions of the artefact due to the good dimensional (milling and turning), surface (control of machining variables), and the dimensional and spatial distribution characteristics. The procedure also includes the same treatment of the captured point clouds (trimming, filtering, and best-fit algorithm, etc.) in each of the four 3D scanning sensors considered. From this process, very reliable measurements of the maximum achievable accuracy of each device (deviations from the CMM measurements) are finally obtained, and a multi-characteristic comparison between the four sensors is performed, also with high reliability.

Keywords: 3D optical scanner; GD&T-based artefact; benchmarking; metrological evaluation; reverse engineering.