Misfit-Strain Phase Diagram, Electromechanical and Electrocaloric Responses in Epitaxial PIN-PMN-PT Thin Films

Materials (Basel). 2022 Oct 31;15(21):7660. doi: 10.3390/ma15217660.

Abstract

xPb(In1/2Nb1/2)O3-(1-x-y)Pb(Mg1/3Nb2/3)O3-yPbTiO3 (PIN-PMN-PT) bulks possess excellent electromechanical coupling and dielectric properties, but the corresponding epitaxial PIN-PMN-PT thin films have not yet been explored. This paper adopts a nonlinear thermodynamics analysis to investigate the influences of misfit strains on the phase structures, electromechanical properties, and electrocaloric responses in epitaxial PIN-PMN-PT thin films. The misfit strain-temperature phase diagram was constructed. The results reveal that the PIN-PMN-PT thin films may exist in tetragonal c-, orthorhombic aa-, monoclinic M-, and paraelectric PE phases. It is also found that the c-M and aa-PE phase boundaries exhibit a superior dielectric constant ε11 which reached 1.979 × 106 with um = -0.494%, as well as the c-M phase boundary showing a large piezoelectric response d15 which reached 1.64 × 105 pm/V. In comparison, the c-PE and M-aa phase boundaries exhibit a superior dielectric constant ε33 over 1 × 105 around um = 0.316% and the piezoelectric response d33 reached 7235 pm/V. The large electrocaloric responses appear near the paraelectric- ferroelectric phase boundary. These insights offer a guidance for experiments in epitaxial PIN-PMN-PT thin films.

Keywords: PIN–PMN–PT; electrocaloric effect; ferroelectric thin films; misfit strain.

Grants and funding

This work was partially supported by the National Natural Science Foundation of China (11702092), and the project was supported by the Hunan Provincial Natural Science Foundation of China (2020JJ5182).