Perovskite solar cells (PSCs) longevity is nowadays the bottleneck for their full commercial exploitation. Although lot of research is ongoing, the initial decay of the output power - an effect known as "burn-in" degradation happening in the first 100 h - is still unavoidable, significantly reducing the overall performance (typically of >20%). In this paper, the origin of the "burn-in" degradation in n-i-p type PSCs is demonstrated that is directly related to Li+ ions migration coming from the SnO2 electron transporting layer visualized by time-of-flight secondary ion mass spectrometry (TOF-SIMS) measurements. To block the ion movement, a thin cross-linked [6,6]-phenyl-C61-butyric acid methyl ester layer on top of the SnO2 layer is introduced, resulting in Li+ immobilization. This results in the elimination of the "burn-in" degradation, showing for the first time a zero "burn-in" loss in the performances while boosting device power conversion efficiency to >22% for triple-cation-based PSCs and >24% for formamidinium-based (FAPbI3 ) PSCs, proving the general validity of this approach and creating a new framework for the realization of stable PSCs devices.
Keywords: Li + ion migration; cross-linked PCBM; operational stability; perovskite solar cells; “burn-in” degradation.
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