A deep learning-based recognition for dangerous objects imaged in X-ray security inspection device

J Xray Sci Technol. 2023;31(1):13-26. doi: 10.3233/XST-221210.

Abstract

Several limitations in algorithms and datasets in the field of X-ray security inspection result in the low accuracy of X-ray image inspection. In the literature, there have been rare studies proposed and datasets prepared for the topic of dangerous objects segmentation. In this work, we contribute a purely manual segmentation for labeling the existing X-ray security inspection dataset namely, SIXRay, with the pixel-level semantic information of dangerous objects. We also propose a composition method for X-ray security inspection images to effectively augment the positive samples. This composition method can quickly obtain the positive sample images using affine transformation and HSV features of X-ray images. Furthermore, to improve the recognition accuracy, especially for adjacent and overlapping dangerous objects, we propose to combine the target detection algorithm (i.e., the softer-non maximum suppression, Softer-NMS) with Mask RCNN, which is named as the Softer-Mask RCNN. Compared with the original model (i.e., Mask RCNN), the Softer-Mask RCNN improves by 3.4% in accuracy (mAP), and 6.2% with adding synthetic data. The study result indicates that our proposed method in this work can effectively improve the recognition performance of dangerous objects depicting in the X-ray security inspection images.

Keywords: Deep learning; data augmentation; mask RCNN; object recognition; security inspection.

Publication types

  • Research Support, Non-U.S. Gov't

MeSH terms

  • Algorithms
  • Deep Learning*
  • Radiography
  • X-Rays