Stress-induced birefringence leads to losses in solid-state laser resonators and amplifiers with polarized output beams. A model of stress-induced birefringence in thin disks is presented, as well as measurements of stress-induced birefringence in a thin disk in a multi-kilowatt oscillator. A full-Stokes imaging polarimeter was developed to enable fast and accurate polarimetric measurements. Experimental and simulated results are in good agreement qualitatively and quantitatively and show that the polarization loss due to stress-induced birefringence is negligible for ytterbium-doped thin disks with a thickness around 100 µm but becomes relevant in thicker disks. It is concluded that stress-induced birefringence should be taken into consideration when designing a thin-disk laser system.