We propose a novel single-plane phase retrieval method to realize high-quality sample reconstruction for lensfree on-chip microscopy. In our method, complex wavefield reconstruction is modeled as a quadratic minimization problem, where total variation and joint denoising regularization are designed to keep a balance of artifact removal and resolution enhancement. In experiment, we built a 3D-printed field-portable platform to validate the imaging performance of our method, where resolution chart, dynamic target, transparent cell, polystyrene beads, and stained tissue sections are employed for the imaging test. Compared to state-of-the-art methods, our method eliminates image degradation and obtains a higher imaging resolution. Different from multi-wavelength or multi-height phase retrieval methods, our method only utilizes a single-frame intensity data record to accomplish high-fidelity reconstruction of different samples, which contributes a simple, robust, and data-efficient solution to design a resource-limited lensfree on-chip microscope. We believe that it will become a useful tool for telemedicine and point-of-care application.