Influence of the Electron Beam and the Choice of Heating Membrane on the Evolution of Si Nanowires' Morphology in In Situ TEM

Materials (Basel). 2022 Jul 29;15(15):5244. doi: 10.3390/ma15155244.

Abstract

We used in situ transmission electron microscopy (TEM) to observe the dynamic changes of Si nanowires under electron beam irradiation. We found evidence of structural evolutions under TEM observation due to a combination of electron beam and thermal effects. Two types of heating holders were used: a carbon membrane, and a silicon nitride membrane. Different evolution of Si nanowires on these membranes was observed. Regarding the heating of Si nanowires on a C membrane at 800 °C and above, a serious degradation dependent on the diameter of the Si nanowire was observed under the electron beam, with the formation of Si carbide. When the membrane was changed to Si nitride, a reversible sectioning and welding of the Si nanowire was observed.

Keywords: TEM; electron beam irradiation; growth; silicon nanowire.

Grants and funding

This research was partly funded by the French national research agency ANR in the framework of “Equipements d’excellence” Project No. 10-EQPX-0050 “TEMPOS–NanoMAX”. Wanghua Chen is grateful for the support from the Natural Science Foundation of Ningbo, China (Grant No. 2021J068).