Special Section Guest Editorial: Hard X-Ray Tomography with Micrometer Resolution

Bert Müller; Stuart R Stock; Ge Wang; Jovan G Brankov

doi:10.1117/1.JMI.9.3.031501

Special Section Guest Editorial: Hard X-Ray Tomography with Micrometer Resolution

J Med Imaging (Bellingham). 2022 May;9(3):031501. doi: 10.1117/1.JMI.9.3.031501. Epub 2022 Jun 30.

Authors

Bert Müller¹, Stuart R Stock², Ge Wang³, Jovan G Brankov⁴

Affiliations

¹ University of Basel, Biomaterials Science Center, Allschwil, Switzerland.
² Northwestern University, Feinberg School of Medicine, Chicago, Illinois, United States.
³ Rensselaer Polytechnic Institute, Biomedical Imaging Center, Troy, New York, United States.
⁴ Illinois Institute of Technology, ECE/BME Department, Chicago, Illinois, United States.

Abstract

JMI guest editors introduce articles collected in the JMI Special Section on Hard X-Ray Tomography with Micrometer Resolution, a snapshot of this important niche area featured by hard x-ray tomography at the micrometer level.