Nanoscale Imaging of Interstitial-Dependent Optical Confinement through Near-Field Scanning Optical Microscopy

Chem Rec. 2022 Jul;22(7):e202200108. doi: 10.1002/tcr.202200108. Epub 2022 May 18.

Abstract

Exploitation of optical confinement in nanoscale unveils a wealth of information about the structure, optical, electronic, and chemical properties of the materials. However, realizing such confinement by optical microscopy and spectroscopic techniques have remained challenging due to fundamental formulation that is related to the diffraction theory of light. A state-of-art technique, known as near-field scanning optical microscopy (NSOM) has the ability to break such diffraction limitation, as the spatial resolution depends on the near-field probe diameter and the distance between the probe and the surface. A home-built apertured NSOM (a-NSOM) developed in the beginning of NSOM discovery facilitated to investigate N-particles nano-assemblies, where N is two or more. Through surface-sensitive spectroscopy such as surface-enhanced Raman scattering (SERS) and surface-enhanced two-photon-induced photoluminescence (TPI-PL), a correlated optometrology was revealed by taking snapshots of shear-force topography, SERS and TPI-PL simultaneously in single-channel and multi-channel detection system. Here in this "Personal Account" we have decorated near-field optical confinement observed by a-NSOM in three constructs; archetype dimer, nano-assembly of few nanoparticles and long-range two-dimensional (2D) nano-assembly. In the case of dimer, optical confinement was localized and interstitial-dependent whereas coalescence of nearby confinements was reported in few particles nanoaggregate. In the case of 2D nano-assembly, optical confinements were more complex because a nanoparticle was surrounded by six or more adjacent nanoparticles. FDTD simulation were carried out to support and validate the experimental observations. Such observations in nanoscale taking snapshots of nanometric topography and surface-sensitive spectroscopic signal not only inspire us to understand optical confinements in near-field, but also implement the concept in designing miniaturized and efficient system.

Keywords: Electromagnetic near-field; FDTD; Near-field scanning optical microscopy; Surface-enhanced Raman scattering; Two-photon-induced photoluminescence.

Publication types

  • Review