A new approach is adopted to grow cadmium zinc telluride (CdZnTe) thin films using the close spaced sublimation (CSS) technique. The deposition parameters for the growth of cadmium telluride (CdTe) thin films onto the glass substrate were optimized. A zinc telluride (ZnTe) thin film layer was deposited onto already-deposited CdTe thin film to fabricate the CdZnTe (CZT) thin film sample as a ternary compound. Annealing was done after the successful deposition of CZT thin films before further characterization of the CZT thin film samples. The structures of the CZT thin film samples were studied using X-ray diffraction (XRD) and cubic phases were found. A spectrophotometer was used to study the optical parameters, and the energy band gap was found to be in the range of 1.45 eV to 1.75 eV after annealing. The nature of the direct band gap predicts that it might be an ideal component in second-generation solar cells. A Hall measurement system was used to find that the electrical conductivity was in the range of 4.6 × 10-6 to 8.2 × 10-11 (ohm cm)-1. XPS analysis confirmed the presence of Zn in the CdTe thin films. A significant change in electronic properties was observed. These results show that these CZT thin film samples can not only play a key role in the tandem structures of high-efficiency solar cells but they could also be used in the detection of X-rays and gamma rays.
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