Structured illumination microscopy (SIM), a super-resolution technology, has a wide range of applications in life sciences. In this study, we present an electro-optic high-speed phase-shift super-resolution microscopy imaging system including 2D SIM, total internal reflection fluorescence-SIM, and 3D SIM modes. This system uses galvanometers and an electro-optic modulator to flexibly and quickly control the phase and direction of structured illumination patterns. Moreover, its design consists of precise timing for improved acquisition speed and software architecture for real-time reconstruction. The highest acquisition rate achieved was 151 frames/s, while the highest real-time super-resolution reconstruction frame rate achieved was over 25 frames/s.