Erratum: An advanced workflow for single-particle imaging with the limited data at an X-ray free-electron laser. Corrigendum

IUCrJ. 2022 Mar 1;9(Pt 2):328. doi: 10.1107/S2052252522000501.

Abstract

[This corrects the article DOI: 10.1107/S2052252520012798.].

Keywords: XFEL; coherent X-ray diffractive imaging (CXDI); free-electron lasers; single particles.

Publication types

  • Published Erratum