Single-shot experiments at the soft X-FEL FERMI using a back-side-illuminated scientific CMOS detector. Corrigendum

Abstract

The name of one of the authors in the article by Léveillé et al. [(2022), J. Synchrotron Rad. 29, 103-110] is corrected.

Keywords: CMOS; single-shot experiment; soft X-ray FEL applications; time resolved.