Dynamic deformation measurement of dual-wavelength arbitrary phase-shifting digital holography with automatic phase-shift detection

Appl Opt. 2022 Feb 10;61(5):B103-B110. doi: 10.1364/AO.440048.

Abstract

Dual-wavelength arbitrary phase-shifting digital holography with automatic phase-shift detection is first proposed in this study. Holograms with two wavelengths and the interference fringes used to detect the phase-shifting amount for each wavelength were simultaneously recorded in one image using the space-division multiplexing technique. Compared with conventional methods, the proposed approach can achieve simultaneous phase shifting of the reference beams of two wavelengths, which substantially reduces recording time and does not require excessive phase-shifting device precision. The proposed and conventional methods were quantitatively evaluated with numerical simulations, and a dynamic deformation measurement was obtained using the system. In the quantitative evaluation of the simulation, the root-mean-square errors of amplitude and phase images reconstructed by the proposed method were reduced by 12% and 19% compared to the conventional method, respectively. Both numerical simulations and experiments verified the effectiveness of the proposed method.