Corrigendum: Identifying single electron charge sensor events using wavelet edge detection (2015 Nanotechnology26 215201)

J R Prance; B J Van Bael; C B Simmons; D E Savage; M G Lagally; Mark Friesen; S N Coppersmith; M A Eriksson

doi:10.1088/1361-6528/ac4284

Corrigendum: Identifying single electron charge sensor events using wavelet edge detection (2015 Nanotechnology26 215201)

Nanotechnology. 2021 Dec 28;33(12). doi: 10.1088/1361-6528/ac4284.

Authors

J R Prance¹, B J Van Bael², C B Simmons², D E Savage², M G Lagally², Mark Friesen², S N Coppersmith², M A Eriksson²

Affiliations

¹ Department of Physics, Lancaster University, Lancaster, LA1 4YB, United Kingdom.
² Department of Physics, University of Wisconsin-Madison, Madison, WI 53706, United States of America.

PMID: 34962232
DOI: 10.1088/1361-6528/ac4284

Abstract

The simulated noise used to benchmark wavelet edge detection in this work was described incorrectly. The correct description is given here, and new results based on noise that matches the original description are provided. The results support our original conclusion, which is that wavelet edge detection outperforms thresholding in the presence of white noise and 1/fnoise.

Keywords: charge detection; quantum information; quantum point contacts; semiconductor quantum dots; wavelet transform.

Publication types

Published Erratum